Probing buried layers by photoelectron spectromicroscopy with hard x-ray excitation

Journal Article · Mon May 28 00:00:00 EDT 2012 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4722940· OSTI ID:22025573

Wiemann, C; Patt, M; Cramm, S ^[1]; Escher, M; Merkel, M ^[2]; Gloskovskii, A ^[3]; Thiess, S; Drube, W ^[4]; Schneider, C M ^[1]

---

1. Peter Gruenberg Institute (PGI-6) and JARA-FIT, Research Centre Juelich, D-52425 Juelich (Germany)
2. FOCUS GmbH, D-65510 Huenstetten (Germany)
3. Institut fuer Anorganische Chemie und Analytische Chemie, Johannes Gutenberg-Universitaet Mainz, D-55128 Mainz (Germany)
4. DESY Photon Science, Deutsches Elektronen-Synchrotron, D-22603 Hamburg (Germany)

We report about a proof-of-principle experiment which explores the perspectives of performing hard x-ray photoemission spectromicroscopy with high lateral resolution. Our results obtained with an energy-filtered photoemission microscope at the PETRA III storage ring facility using hard x-ray excitation up to 6.5 keV photon energy demonstrate that it is possible to obtain selected-area x-ray photoemission spectra from regions less than 500 nm in diameter.

• OSTI ID: 22025573
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 22 Vol. 100; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
EXCITATION
HARD X RADIATION
KEV RANGE
LAYERS
MICROSCOPES
MICROSCOPY
PHOTOEMISSION
RESOLUTION
STORAGE RINGS
X-RAY PHOTOELECTRON SPECTROSCOPY