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Hard x-ray nanoprobe of beamline P06 at PETRA III

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4952830· OSTI ID:22608344
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  1. Institute of Optics and Photonics of Condensed Matter, Technische Universität Chemnitz, D-09126 Chemnitz (Germany)
  2. Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg (Germany)
  3. Institut für Strukturphysik, Technische Universität Dresden, D-01062 Dresden (Germany)

The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

OSTI ID:
22608344
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1741; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

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