SHI Induced Modifications in CdS/CuInSe{sub 2} Thin Film: XRD Analysis

Journal Article · Fri Jul 15 04:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3606024· OSTI ID:21608182

Joshi, Rajesh A; Taur, Vidya S; Sharma, Ramphal ^[1]; Ghule, Anil V ^[2]

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1. Thin Film and Nanotechnology Laboratory, Department of Physics, Dr. Babasaheb Ambedkar Marathwada University, Aurangabad 431004, Maharashtra (India)
2. Department of Nanotechnology, Dr. Babasaheb Ambedkar Marathwada University, Aurangabad 431004, Maharashtra (India)

CuInSe{sub 2}(CIS nanostructured) thin films were prepared by ion exchange method at room temperature on ITO coated glass substrates in an alkaline medium. The as prepared thin films were irradiated by 120 MeV Au{sup 9+} swift heavy ion (SHI) at 5x10{sup 11} and 5x10{sup 12} ions/cm{sup 2} fluence respectively. To study the effect of irradiation, the pristine and irradiated nanostructured thin films were characterized by X ray Diffraction (XRD) and analyzed the improvement in crystalline quality and crystallite size. The observed structural modifications discussed considering the high electronic energy deposition by 120 MeV gold heavy (Au{sup 9+}) ions in CuInSe{sub 2} thin films.

• OSTI ID: 21608182
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1349; ISSN 0094-243X; ISSN APCPCS
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
BEAMS
CADMIUM COMPOUNDS
CADMIUM SULFIDES
CHALCOGENIDES
CHARGED PARTICLES
COHERENT SCATTERING
CRYSTAL STRUCTURE
CRYSTALS
DIFFRACTION
ENERGY RANGE
FILMS
GLASS
GOLD IONS
INDIUM COMPOUNDS
INDIUM SELENIDES
INORGANIC PHOSPHORS
ION BEAMS
ION EXCHANGE
IONS
IRRADIATION
MEV RANGE
MODIFICATIONS
NANOSTRUCTURES
PHOSPHORS
SCATTERING
SELENIDES
SELENIUM COMPOUNDS
SUBSTRATES
SULFIDES
SULFUR COMPOUNDS
TEMPERATURE RANGE
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
X-RAY DIFFRACTION