Room Temperature Ferromagnetism in Cu Doped ZnO Thin Films

Journal Article · Fri Jul 15 04:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3606279· OSTI ID:21608129

Khan, Zaheer Ahmed; Ghosh, Subhasis ^[1]

---

1. School of Physical Sciences, Jawaharlal Nehru University, New Delhi-110067 (India)

We report on the growth of Cu doped ZnO thin films for different Cu concentration from 0.1%, to10% by RF magnetron sputtering. The X-ray diffraction study has shown single phase wurtzite type ZnO thin films with no evidence of copper/copper oxide or any other secondary phases. Room temperature ferromagnetism was observed in RF sputtered Cu doped ZnO films with magnetic moment per Cu atom first increasing and then decreasing with an increasing Cu content. Decrease of band gap with Cu doping, indicating strong p-d mixing of O and Cu is clear by the absorption spectroscopy study. The surface morphology by AFM of pure and Cu doped ZnO thin films show average grain size of 110nm and RMS surface roughness of 2.15 nm.

• OSTI ID: 21608129
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1349; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTROSCOPY
ATOMIC FORCE MICROSCOPY
CHALCOGENIDES
COHERENT SCATTERING
COPPER
COPPER COMPOUNDS
COPPER OXIDES
CRYSTAL GROWTH
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CUBIC LATTICES
DIFFRACTION
DOPED MATERIALS
ELEMENTS
FERROMAGNETIC MATERIALS
FERROMAGNETISM
FILMS
GRAIN SIZE
MAGNETIC MATERIALS
MAGNETIC MOMENTS
MAGNETISM
MATERIALS
METALS
MICROSCOPY
MICROSTRUCTURE
MORPHOLOGY
OXIDES
OXYGEN COMPOUNDS
ROUGHNESS
SCATTERING
SEMICONDUCTOR MATERIALS
SIZE
SPECTROSCOPY
SPUTTERING
SURFACE PROPERTIES
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
X-RAY DIFFRACTION
ZINC COMPOUNDS
ZINC OXIDES