The influence of diffusion temperature on the structural, optical and magnetic properties of manganese-doped zinc oxysulfide thin films
- Department of Physics, Karadeniz Technical University, 61080 Trabzon (Turkey)
- SoloPower Inc., 5981 Optical Ct., San Jose, CA 95138 (United States)
We investigated the structural, optical and magnetic properties of Mn-doped zinc oxysulfide films. Zn(O,S) films were deposited by a spray pyrolysis method on glass substrate. A thin Mn layer evaporated on these films served as the source for the diffusion doping. The XRD pattern of undoped films revealed the presence of two wurtzite phases corresponding to ZnS and ZnO with a strong preferred orientation along the ZnS (0 0 2) hexagonal plane direction. SEM showed a similar surface morphology for the undoped and Mn-doped films, displaying regular arrays of hexagonal micro-rods perpendicular to the substrate. The optical transmission measurements showed that both undoped and Mn diffusion-doped films had a low average transmittance less than about 10%. The gap energy is decreased from 3.42 to 3.33 eV upon annealing at 400 deg. C. Photoluminescence studies at 300 K show that the incorporation of manganese leads to a decrease of deep level band intensity compared to undoped sample. Clear ferromagnetic loops were observed for the Mn-doped Zn(O,S) films, which might be due to the presence of point defects. - Graphical abstract: M-H variation of Mn diffusion-doped Zn(O,S) thin films measured at 300 K. Highlights: > Zinc oxysulfide thin films fabricated by spray pyrolysis and doped with Mn. > Regular arrays of hexagonal micro-rods perpendicular to the substrate. > Optical transmission measurements showed that both undoped and Mn diffusion-doped films had a low average transmittance less than about 10%. > Magnetic measurements show that Mn-doped zinc oxysulfide thin films exhibit a ferromagnetism behavior at room temperature.
- OSTI ID:
- 21580022
- Journal Information:
- Journal of Solid State Chemistry, Vol. 184, Issue 10; Other Information: DOI: 10.1016/j.jssc.2011.07.017; PII: S0022-4596(11)00386-0; Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
DIFFUSION
DOPED MATERIALS
FERROMAGNETISM
GRAIN ORIENTATION
MAGNETIC PROPERTIES
MANGANESE
OXYSULFIDES
PHOTOLUMINESCENCE
POINT DEFECTS
PYROLYSIS
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY
ZINC
ZINC OXIDES
ZINC SULFIDES
CHALCOGENIDES
CHEMICAL REACTIONS
COHERENT SCATTERING
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DECOMPOSITION
DIFFRACTION
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
FILMS
INORGANIC PHOSPHORS
LUMINESCENCE
MAGNETISM
MATERIALS
METALS
MICROSCOPY
MICROSTRUCTURE
ORIENTATION
OXIDES
OXYGEN COMPOUNDS
PHOSPHORS
PHOTOELECTRON SPECTROSCOPY
PHOTON EMISSION
PHYSICAL PROPERTIES
SCATTERING
SPECTROSCOPY
SULFIDES
SULFUR COMPOUNDS
THERMOCHEMICAL PROCESSES
TRANSITION ELEMENTS
ZINC COMPOUNDS