Effect of O{sub 2}{sup +}, H{sub 2}{sup +}+ O{sub 2}{sup +}, and N{sub 2}{sup +}+ O{sub 2}{sup +} ion-beam irradiation on the field emission properties of carbon nanotubes
- Instituto de Fisica 'Gleb Wataghin', UNICAMP, P.O. Box 6165 Campinas, SP, 13083-970 (Brazil)
- INQUIMAE, FCEyN-UBA-CONICET, Ciudad Universitaria, Pabellon II, Buenos Aires (Argentina)
- Depto. Fisica, FECyN, UBA, Ciudad Universitaria, Pabellon II, Buenos Aires (Argentina)
- Instituto de Fisica de Sao Carlos-USP, P.O. Box 369, Sao Carlos 13560-250 (Brazil)
The effect of O{sub 2}{sup +}, H{sub 2}{sup +}+ O{sub 2}{sup +}, and N{sub 2}{sup +}+ O{sub 2}{sup +} ion-beam irradiation of carbon nanotubes (CNTs) films on the chemical and electronic properties of the material is reported. The CNTs were grown by the chemical vapor deposition technique (CVD) on silicon TiN coated substrates previously decorated with Ni particles. The Ni decoration and TiN coating were successively deposited by ion-beam assisted deposition (IBAD) and afterwards the nanotubes were grown. The whole deposition procedure was performed in situ as well as the study of the effect of ion-beam irradiation on the CNTs by x-ray photoelectron spectroscopy (XPS). Raman scattering, field-effect emission gun scanning electron microscopy (FEG-SEM), and field emission (FE) measurements were performed ex situ. The experimental data show that: (a) the presence of either H{sub 2}{sup +} or N{sub 2}{sup +} ions in the irradiation beam determines the oxygen concentration remaining in the samples as well as the studied structural characteristics; (b) due to the experimental conditions used in the study, no morphological changes have been observed after irradiation of the CNTs; (c) the FE experiments indicate that the electron emission from the CNTs follows the Fowler-Nordheim model, and it is dependent on the oxygen concentration remaining in the samples; and (d) in association with FE results, the XPS data suggest that the formation of terminal quinone groups decreases the CNTs work function of the material.
- OSTI ID:
- 21538420
- Journal Information:
- Journal of Applied Physics, Vol. 109, Issue 11; Other Information: DOI: 10.1063/1.3593269; (c) 2011 American Institute of Physics; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
CARBON
ELECTRON EMISSION
FIELD EMISSION
HYDROGEN
ION BEAMS
MOLECULAR IONS
NANOTUBES
NITROGEN OXIDES
OXYGEN
PHYSICAL RADIATION EFFECTS
RAMAN EFFECT
RAMAN SPECTRA
SCANNING ELECTRON MICROSCOPY
SILICON
SUBSTRATES
THIN FILMS
TITANIUM NITRIDES
WATER
WORK FUNCTIONS
X-RAY PHOTOELECTRON SPECTROSCOPY
BEAMS
CHALCOGENIDES
CHARGED PARTICLES
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
FILMS
FUNCTIONS
HYDROGEN COMPOUNDS
IONS
MICROSCOPY
NANOSTRUCTURES
NITRIDES
NITROGEN COMPOUNDS
NONMETALS
OXIDES
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
PNICTIDES
RADIATION EFFECTS
SEMIMETALS
SPECTRA
SPECTROSCOPY
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS