Preparation and characterization of CNT-CeO{sub 2} nanocomposite

Journal Article · Wed Jun 24 04:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4917820· OSTI ID:22490335

Kaur, Jasmeet; Anand, Kanika; Singh, Ravi Chand ^[1]

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1. Department of Physics, Guru Nanak Dev University, Amritsar-143005 (India)

This paper reports decoration of CeO{sub 2} nanoparticles on multi-walled carbon nanotubes through a reflux process in which Ce (NO{sub 3}) {sub 3}·6H{sub 2}O serves as precursor and hydrazine hydrate (N{sub 2}H{sub 4}.H{sub 2}O) as reducing agent. Successful deposition of cubic fluorite CeO{sub 2} nanoparticles onto multi-walled carbon nanotubes has been confirmed by x-ray diffraction (XRD), Raman spectroscopy, field-emission scanning electron microscopy (FE-SEM) and energy dispersive x-ray spectroscopy (EDS). It was found that CeO{sub 2} nanoparticles formed in the presence of CNTs were larger as compared to pure CeO{sub 2} nanoparticles. Raman analysis showed that CeO{sub 2} induced a decrease in the size of the carbon grain in the CNTs. A red shift from 460 cm{sup −1} to 463 cm{sup −1} for F{sub 2g} mode of CeO{sub 2} has also been observed in Raman spectra of CNT- CeO{sub 2} nanocomposite as compared to pure CeO{sub 2}. The CeO{sub 2} coated multi-wall carbon nanotubes (CNT-CeO{sub 2}) nanocomposite would be a promising candidate for practical applications such as catalysis, sensing and power source applications.

• OSTI ID: 22490335
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1665; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
CARBON NANOTUBES
CATALYSIS
CERIUM NITRATES
CERIUM OXIDES
COMPARATIVE EVALUATIONS
CUBIC LATTICES
DEPOSITION
FIELD EMISSION
HYDRATES
HYDRAZINE
NANOCOMPOSITES
NANOPARTICLES
RAMAN SPECTRA
RAMAN SPECTROSCOPY
RED SHIFT
REDUCING AGENTS
SCANNING ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY