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Title: Epitaxial integration of photoresponsive Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} with Si(001)

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3561371· OSTI ID:21538173
; ; ; ;  [1];  [2]
  1. Department of Physics, Astronomy and Geosciences, Towson University, 8000 York Rd., Towson, Maryland 21252 (United States)
  2. Motorola Inc., 2900 S. Diablo Way, Bldg. A Suite 150, Tempe, Arizona 85282 (United States)

Previously it has been shown that the resistivity of Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} epitaxial thin films on oxide substrates decreases significantly upon illumination with visible light. The resistivity decrease is observed over a wide temperature range and is understood as arising due to the destruction of charge ordering. The light responsivity makes Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} thin films attractive for photonic and optoelectronic device applications. In this paper, we report the heteroepitaxy of Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} thin films on (001) Si which is relevant for the potential integration of the optoelectronic/photonic functionality of Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} with semiconductor electronics. As in the case of other perovskite oxides, heteroepitaxy of Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} on Si requires the use of buffer layers to circumvent the problems associated with the presence of an amorphous native silicon dioxide layer and the reactivity of perovskite oxides with Si at high temperatures. We demonstrate that high quality epitaxial thin films of Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} can be grown via pulse laser deposition on Si that has been prebuffered with a SrTiO{sub 3} layer via a Motorola molecular beam epitaxy process. The magnitude and dynamics of the photoresponse in these films is comparable to that of Bi{sub 0.4}Ca{sub 0.6}MnO{sub 3} films on oxide substrates.

OSTI ID:
21538173
Journal Information:
Journal of Applied Physics, Vol. 109, Issue 6; Other Information: DOI: 10.1063/1.3561371; (c) 2011 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English

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