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Band offsets between SiO{sub 2} and phase change materials in the (GeTe){sub x}(Sb{sub 2}Te{sub 3}){sub 1-x} pseudobinary system

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.3573787· OSTI ID:21518357
;  [1]; ;  [2]; ;  [3];  [4]
  1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 119260 (Singapore)
  2. Data Storage Institute, Agency for Science, Technology and Research (A-STAR), DSI Building, 5 Engineering Drive 1, Singapore 117608 (Singapore)
  3. Institute of Materials Research and Engineering, Agency for Science, Technology and Research (A-STAR), 3 Research Link, Singapore 117602 (Singapore)
  4. Singapore University of Technology and Design, 287 Ghim Moh Road 04-00, Singapore 279623 (Singapore)
The energy band alignment between stoichiometric phase change alloys residing along the pseudobinary line of GeTe-Sb{sub 2}Te{sub 3}[(GeTe){sub x}(Sb{sub 2}Te{sub 3}){sub 1-x}] and SiO{sub 2} was obtained employing high-resolution x-ray photoelectron spectroscopy. The valence band offsets were determined using both the core-level spectra and valence band spectra in the analysis. The results obtained show that the band offsets vary with the composition of the (GeTe){sub x}(Sb{sub 2}Te{sub 3}){sub 1-x} alloy, exhibiting a parabolic dependence on the amount of GeTe in the alloy. Increasing the proportion of GeTe in the (GeTe){sub x}(Sb{sub 2}Te{sub 3}){sub 1-x} alloy was generally found to increase (decrease) the valence band (conduction band) offsets, while the binary alloys (GeTe, Sb{sub 2}Te{sub 3}) have similar band offset values. This information could be useful for phase change memory device design and optimization.
OSTI ID:
21518357
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 13 Vol. 98; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English