Multiple phosphorus chemical sites in heavily phosphorus-doped diamond
- Graduate School of Natural Science and Technology, Okayama University, 3-1-1 Tsushima-naka, Okayama 700-8530 (Japan)
- The Graduate School of Natural Science and Technology, Okayama University, 3-1-1 Tsushima-naka, Okayama 700-8530 (Japan)
- Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)
- Energy Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Center 2, Tsukuba, Ibaraki 305-8568 (Japan)
- National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047 (Japan)
- Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047 (Japan)
We have performed high-resolution core level photoemission spectroscopy on a heavily phosphorus (P)-doped diamond film in order to elucidate the chemical sites of doped-phosphorus atoms in diamond. P 2p core level study shows two bulk components, providing spectroscopic evidence for multiple chemical sites of doped-phosphorus atoms. This indicates that only a part of doped-phosphorus atoms contribute to the formation of carriers. From a comparison with band calculations, possible origins for the chemical sites are discussed.
- OSTI ID:
- 21518291
- Journal Information:
- Applied Physics Letters, Vol. 98, Issue 8; Other Information: DOI: 10.1063/1.3554699; (c) 2011 American Institute of Physics; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMS
COMPARATIVE EVALUATIONS
DIAMONDS
DOPED MATERIALS
PHOSPHORUS ADDITIONS
PHOTOEMISSION
RESOLUTION
SEMICONDUCTOR MATERIALS
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
ALLOYS
CARBON
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
EVALUATION
FILMS
MATERIALS
MINERALS
NONMETALS
PHOTOELECTRON SPECTROSCOPY
SECONDARY EMISSION
SPECTROSCOPY
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMS
COMPARATIVE EVALUATIONS
DIAMONDS
DOPED MATERIALS
PHOSPHORUS ADDITIONS
PHOTOEMISSION
RESOLUTION
SEMICONDUCTOR MATERIALS
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
ALLOYS
CARBON
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
EVALUATION
FILMS
MATERIALS
MINERALS
NONMETALS
PHOTOELECTRON SPECTROSCOPY
SECONDARY EMISSION
SPECTROSCOPY