Crystal coherence length effects on the infrared optical response of MgO thin films

Journal Article · Sun Nov 07 23:00:00 EST 2010 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3515901· OSTI ID:21464558

Ihlefeld, J F; Ginn, J C; Rodriguez, M A; Kotula, P G; Carroll, III, J F; Clem, P G; Sinclair, M B ^[1]; Shelton, D J; Boreman, G D ^[2]; Matias, V ^[3]

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1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
2. College of Optics and Photonics/CREOL, University of Central Florida, Orlando, Florida 32816 (United States)
3. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

The role of crystal coherence length on the infrared optical response of MgO thin films was investigated with regard to Reststrahlen band photon-phonon coupling. Preferentially (001)-oriented sputtered and evaporated ion-beam assisted deposited thin films were prepared on silicon and annealed to vary film microstructure. Film crystalline coherence was characterized by x-ray diffraction line broadening and transmission electron microscopy. The infrared dielectric response revealed a strong dependence of dielectric resonance magnitude on crystalline coherence. Shifts to lower transverse optical phonon frequencies were observed with increased crystalline coherence. Increased optical phonon damping is attributed to increasing granularity and intergrain misorientation.

• OSTI ID: 21464558
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 19 Vol. 97; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
ANNEALING
CHALCOGENIDES
COHERENCE LENGTH
COHERENT SCATTERING
COUPLING
CRYSTAL STRUCTURE
CRYSTALS
DAMPING
DEPOSITION
DIELECTRIC MATERIALS
DIFFRACTION
DIMENSIONS
ELECTRON MICROSCOPY
ELEMENTS
FILMS
HEAT TREATMENTS
INFRARED SPECTRA
LENGTH
LINE BROADENING
MAGNESIUM COMPOUNDS
MAGNESIUM OXIDES
MATERIALS
MICROSCOPY
MICROSTRUCTURE
OXIDES
OXYGEN COMPOUNDS
PHONONS
QUASI PARTICLES
RESONANCE
SCATTERING
SEMIMETALS
SILICON
SPECTRA
SPUTTERING
TEXTURE
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION