Crystal coherence length effects on the infrared optical response of MgO thin films
- Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
- College of Optics and Photonics/CREOL, University of Central Florida, Orlando, Florida 32816 (United States)
- Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
The role of crystal coherence length on the infrared optical response of MgO thin films was investigated with regard to Reststrahlen band photon-phonon coupling. Preferentially (001)-oriented sputtered and evaporated ion-beam assisted deposited thin films were prepared on silicon and annealed to vary film microstructure. Film crystalline coherence was characterized by x-ray diffraction line broadening and transmission electron microscopy. The infrared dielectric response revealed a strong dependence of dielectric resonance magnitude on crystalline coherence. Shifts to lower transverse optical phonon frequencies were observed with increased crystalline coherence. Increased optical phonon damping is attributed to increasing granularity and intergrain misorientation.
- OSTI ID:
- 21464558
- Journal Information:
- Applied Physics Letters, Vol. 97, Issue 19; Other Information: DOI: 10.1063/1.3515901; (c) 2010 American Institute of Physics; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNEALING
COHERENCE LENGTH
COUPLING
CRYSTAL STRUCTURE
CRYSTALS
DAMPING
DEPOSITION
DIELECTRIC MATERIALS
INFRARED SPECTRA
LINE BROADENING
MAGNESIUM OXIDES
MICROSTRUCTURE
PHONONS
RESONANCE
SILICON
SPUTTERING
TEXTURE
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
ALKALINE EARTH METAL COMPOUNDS
CHALCOGENIDES
COHERENT SCATTERING
DIFFRACTION
DIMENSIONS
ELECTRON MICROSCOPY
ELEMENTS
FILMS
HEAT TREATMENTS
LENGTH
MAGNESIUM COMPOUNDS
MATERIALS
MICROSCOPY
OXIDES
OXYGEN COMPOUNDS
QUASI PARTICLES
SCATTERING
SEMIMETALS
SPECTRA