Effect of insulator sleeve material on the x-ray emission from a plasma focus device

Journal Article · Wed Sep 15 04:00:00 EDT 2010 · Physics of Plasmas

DOI:https://doi.org/10.1063/1.3484875· OSTI ID:21432284

Hussain, S; Badar, M A ^[1]; Shafiq, M; Zakaullah, M ^[2]

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1. Department of Physics, University of Sargodha, Sargodha 40100 (Pakistan)
2. Department of Physics, Quaid-i-Azam University, Islamabad 45320 (Pakistan)

The effect of insulator sleeve material on x-ray emission from a 2.3 kJ Mather type plasma focus device operated in argon-hydrogen mixture is investigated. The time and space resolved x-ray emission characteristics are studied by using a three channel p-i-n diode x-ray spectrometer and a multipinhole camera. The x-ray emission depends on the volumetric ratio of argon-hydrogen mixture as well as the filling pressure and the highest x-ray emission is observed for a volumetric ratio 40% Ar to 60%H{sub 2} at 2.5 mbar filling pressure. The fused silica insulator sleeve produces the highest x-ray emission whereas nonceramic insulator sleeves such as nylon, Perspex, or Teflon does not produce focus or x-rays. The pinhole images of the x-ray emitting zones reveal that the contribution of the Cu K{alpha} line is weak and plasma x-rays are intense. The highest plasma electron temperature is estimated to be 3.3 and 3.6 keV for Pyrex glass and fused silica insulator sleeves, respectively. It is speculated that the higher surface resistivity of fused silica is responsible for enhanced x-ray emission and plasma electron temperature.

• OSTI ID: 21432284
• Journal Information: Physics of Plasmas, Journal Name: Physics of Plasmas Journal Issue: 9 Vol. 17; ISSN PHPAEN; ISSN 1070-664X
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ARGON
BOROSILICATE GLASS
DISPERSIONS
ELECTROMAGNETIC RADIATION
ELECTRON TEMPERATURE
ELEMENTS
EMISSION
ESTERS
FLUIDS
FLUORINATED ALIPHATIC HYDROCARBONS
GASES
GLASS
HALOGENATED ALIPHATIC HYDROCARBONS
HYDROGEN
IONIZING RADIATIONS
MATERIALS
MEASURING INSTRUMENTS
MINERALS
MIXTURES
NONMETALS
NYLON
OPEN PLASMA DEVICES
ORGANIC COMPOUNDS
ORGANIC FLUORINE COMPOUNDS
ORGANIC HALOGEN COMPOUNDS
ORGANIC POLYMERS
OXIDE MINERALS
PERSPEX
PETROCHEMICALS
PETROLEUM PRODUCTS
PLASMA DIAGNOSTICS
PLASMA FOCUS DEVICES
PLASTICS
POLYACRYLATES
POLYAMIDES
POLYETHYLENES
POLYMERS
POLYOLEFINS
POLYTETRAFLUOROETHYLENE
POLYVINYLS
PYREX
RADIATIONS
RARE GASES
SILICA
SPECTROMETERS
SYNTHETIC MATERIALS
TEFLON
THERMONUCLEAR DEVICES
X RADIATION
X-RAY SPECTROMETERS