Development of Micron-Resolved Electron Spectroscopy to Study Organic Thin Films in Real Devices

Journal Article · Wed Jun 23 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3463242· OSTI ID:21431072

Wang, C -H; Fan, L -J ^[1]; Yang, Y -W ^[1]; Su, J -W; Chan, S -W ^[2]; Chen, M -C ^[3]

---

1. National Synchrotron Radiation Research Center, Hsinchu, Taiwan 30076 (China)
2. Department of Chemistry, National Tsing-Hua University, Hsinchu, Taiwan 30013 (China)
3. Department of Chemistry, National Central University, Jhongli, Taiwan 32001 (China)

A straightforward application of an electron energy analyzer equipped with an image detector to micron-resolved electron spectroscopic studies of organic thin film devices is reported. The electron spectroscopies implemented include synchrotron-based UPS, XPS, and Auger yield NEXAFS. Along the non-energy-dispersion direction of the analyzer, a spatial resolution of {approx}40 {mu}m is obtained through the employment of entrance slits, electrostatic lenses and segmented CCD detector. One significant benefit offered by the technique is that the electronic transport and electronic structure of the same micron-sized sample can be directly examined. The example illustrated is a top-contact organic field effect transistor (OFET) fabricated from semiconducting triethylsilylethynyl anthradithiophene and gold electrodes. It is found that an extensive out-diffusion of gold atoms to adjacent conduction channels takes place, presumably due to the inability of soft organic materials in dissipating the excess energy with which gaseous Au atoms possess.

• OSTI ID: 21431072
• Journal Information: AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463242; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTROSCOPY
ATOMS
CHARGE-COUPLED DEVICES
DIFFUSION
DISPERSIONS
ELECTRONIC STRUCTURE
ELECTRONS
ELECTROSTATIC LENSES
FIELD EFFECT TRANSISTORS
FINE STRUCTURE
GOLD
SPATIAL RESOLUTION
SYNCHROTRONS
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
X-RAY SPECTROSCOPY
ACCELERATORS
CYCLIC ACCELERATORS
ELECTRON SPECTROSCOPY
ELEMENTARY PARTICLES
ELEMENTS
FERMIONS
FILMS
LENSES
LEPTONS
METALS
PHOTOELECTRON SPECTROSCOPY
RESOLUTION
SEMICONDUCTOR DEVICES
SPECTROSCOPY
TRANSISTORS
TRANSITION ELEMENTS