Nanoscopium: a Scanning Hard X-ray Nanoprobe Beamline at Synchrotron Soleil

Journal Article · Wed Jun 23 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3463222· OSTI ID:21410260

Somogyi, A; Polack, F; Moreno, T ^[1]

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1. Synchrotron Soleil, L'Orme des Merisiers, Saint-Aubin-BP 48, 91192 GIF-sur-YVETTE CEDEX (France)

Nanoscopium is the single scanning hard X-ray nano-probe beamline planned at SOLEIL. This {approx}155 m long beamline will fully exploit the high brilliance and coherence characteristics of the X-ray beam both for diffraction limited focusing and for contrast formation. It will offer the most advanced imaging techniques in multimodal mode and will be a research tool for a wide user community working in the fields of earth-, environmental-, and life-sciences. The different {mu}-{mu}nano-probe techniques offered by the beamline will permit elemental mapping at trace (ppm) levels (scanning XRF), speciation mapping (XANES), phase gradient mapping (scanning differential phase contrast), and density-contrast based imaging of internal structures (coherent diffraction imaging) in the 30 nm to 1 {mu}m spatial resolution range, also in ''in situ conditions''. Nanoscopium will cover the 5-20 keV energy range. The stability of the nanobeam will be ensured by horizontally reflecting beamline optics (a sagitally and a tangentially pre-focusing mirror, horizontally reflecting monochromators) in front of the overfilled secondary source. Trade-off between high energy resolution ({Delta}E/E{approx}10{sup -4}) and high flux (10{sup 11} ph/s with {Delta}E/E{approx}10{sup -2}) will be achieved by two interchangeable monochromators (a double crystal and a double multilayer one). KB mirror and FZP lenses will be used as focusing devices. The beamline is in the design and construction phase. It is foreseen to be open for users at the beginning of 2013.

• OSTI ID: 21410260
• Journal Information: AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463222; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ABSORPTION SPECTROSCOPY
BEAMS
COHERENT RADIATION
CRYSTALS
DENSITY
ENERGY RESOLUTION
HARD X RADIATION
KEV RANGE
LAYERS
MIRRORS
MONOCHROMATORS
OPTICS
SPATIAL RESOLUTION
STABILITY
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
X-RAY DIFFRACTION
X-RAY FLUORESCENCE ANALYSIS
X-RAY SPECTROSCOPY
ACCELERATORS
CHEMICAL ANALYSIS
COHERENT SCATTERING
CYCLIC ACCELERATORS
DIFFRACTION
ELECTROMAGNETIC RADIATION
ENERGY RANGE
IONIZING RADIATIONS
NONDESTRUCTIVE ANALYSIS
PHYSICAL PROPERTIES
RADIATION SOURCES
RADIATIONS
RESOLUTION
SCATTERING
SPECTROSCOPY
X RADIATION
X-RAY EMISSION ANALYSIS