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Title: Portable TXRF Spectrometer with 10{sup -11}g Detection Limit and Portable XRF Spectromicroscope with Sub-mm Spatial Resolution

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3399251· OSTI ID:21371762
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  1. Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto, 606-8501 (Japan)

A portable total reflection X-ray fluorescence (TXRF) spectrometer that we have developed is applied to trace elemental analysis of water solutions. Although a 5 W X-ray tube is used in the portable TXRF spectrometer, detection limits of several ppb are achieved for 3d transition metal elements and trace elements in a leaching solution of soils, a leaching solution of solder, and alcoholic beverages are detected. Portable X-ray fluorescence (XRF) spectromicroscopes with a 1 W X-ray tube and an 8 W X-ray tube are also presented. Using the portable XRF spectromicroscope with the 1 W X-ray tube, 93 ppm of Cr is detected with an about 700 {mu}m spatial resolution. Spatially resolved elemental analysis of a mug painted with blue, red, green, and white is performed using the two portable spectromicroscopes, and the difference in elemental composition at each paint is detected.

OSTI ID:
21371762
Journal Information:
AIP Conference Proceedings, Vol. 1221, Issue 1; Conference: 20. international congress on X-ray optics and microanalysis, Karlsruhe (Germany), 15-18 Sep 2009; Other Information: DOI: 10.1063/1.3399251; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English