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Title: Influence of Quantum-Dots Density on Average In-Plane Strain of Optoelectronic Devices by X-Ray Renninger Scanning

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3295448· OSTI ID:21371408
; ;  [1]
  1. Instituto de Fisica, Universidade de Sao Paulo, Sao Paulo, SP (Brazil)

In this work, we exploit the synchrotron X-ray Renninger scanning to inspect in-plane strain introduced in the capping process of InAs/GaAs (001) quantum dots as a function of their growth rates.

OSTI ID:
21371408
Journal Information:
AIP Conference Proceedings, Vol. 1199, Issue 1; Conference: 29. international conference on the physics of semiconductors, Rio de Janeiro (Brazil), 27 Jul - 1 Aug 2008; Other Information: DOI: 10.1063/1.3295448; (c) 2009 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English