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Phase separation and exchange biasing in the ferromagnetic IV-VI semiconductor Ge{sub 1-x}Mn{sub x}Te

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.3459149· OSTI ID:21367012
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  1. Institut fuer Halbleiter- und Festkpoerperphysik, Johannes Kepler Universitaet Linz, 4040 Linz (Austria)

Ferromagnetic Ge{sub 1-x}Mn{sub x}Te grown by molecular beam epitaxy with Mn content of x{sub Mn}approx =0.5 is shown to exhibit a strong tendency for phase separation. At higher growth temperatures apart from the cubic Ge{sub 0.5}Mn{sub 0.5}Te, a hexagonal MnTe and a rhombohedral distorted Ge{sub 0.83}Mn{sub 0.17}Te phase is formed. This coexistence of antiferromagnetic MnTe and ferromagnetic Ge{sub 0.5}Mn{sub 0.5}Te results in magnetic exchange-bias effects.

OSTI ID:
21367012
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 2 Vol. 97; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English