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Modulating microstructure and magnetic properties of BaFe{sub 12}O{sub 19} thin films by using Pt and yttria stabilized zirconia underlayers

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3272811· OSTI ID:21359398
; ; ;  [1]; ;  [2]
  1. Department of Physics, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou 215006 (China)
  2. Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215125 (China)
The c-axis oriented barium ferrite thin films were prepared by radio frequency magnetron sputtering on silicon substrates with a metal underlayer Pt (111) as well as an oxide underlayer yttria stabilized zirconia (YSZ). Microstructural studies (scanning electron microscopy, atomic force microscopy, and magnetic force microscopy) showed that the magnetic grains in BaM film have a strong relationship with the grains in the underlayer. The Pt underlayer is more effective in forming micrometer-sized and multidomain magnetic grains, which have high saturation magnetization but small coercivity and remanence of the BaM film. On the contrary, the YSZ underlayer is favorable to obtain nanometer-sized and monodomain magnetic grains, which lead to a slight decrease in saturation magnetization but dramatically increase coercivity and remanence of the BaM film. Hence, with careful selection of underlayer, it is feasible to obtain suitable magnetic grain size and domain structure of BaM films to satisfy special requirements.
OSTI ID:
21359398
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 12 Vol. 106; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English