Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Electron bunch length monitors using spatially encoded electro-optical technique in an orthogonal configuration

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.3266919· OSTI ID:21294495
; ; ;  [1]; ;  [2]
  1. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)
  2. Instrumentation Division, Brookhaven National Laboratory, Upton, New York 11973 (United States)

A single-shot, nondestructive, electro-optical, electron bunch length monitor is experimentally verified by encoding the Coulomb field of the bunch profile on the spatial intensity distribution of an unchirped femtosecond laser pulse in an orthogonal geometry, hence a temporal-to-spatial transformation. This electron bunch measurement scheme can simultaneously measure large timing jitter (approximately in picoseconds) with a wide measurement time span covering picosecond to subpicosecond ranges.

OSTI ID:
21294495
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 23 Vol. 95; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

Similar Records

Electron Bunch Length Monitors using Spatially Encoded Electro-optical Technique
Journal Article · Fri Dec 30 23:00:00 EST 2011 · Nuclear Instruments and Methods in Physics Research, Section A · OSTI ID:1041756

Single-shot electron bunch length measurements using a spatial electro-optical autocorrelation interferometer
Journal Article · Fri Oct 15 00:00:00 EDT 2010 · Review of Scientific Instruments · OSTI ID:22058635

ELECTRON BUNCH CHARACTERIZATION WITH SUBPICOSECOND RESOLUTION USING ELECTRO-OPTIC TECHNIQUE.
Conference · Mon Jun 11 00:00:00 EDT 2001 · OSTI ID:782052