Sublattice identification in noncontact atomic force microscopy of the NaCl(001) surface
- Physikalisches Institut and DFG Center for Functional Nanostructures (CFN), Universitaet Karlsruhe, D-76128 Karlsruhe (Germany)
- Physikalisches Institut, Westfaelische Wilhelms-Universitaet Muenster, Wilhelm-Klemm-Strasse 10, 48149 Muenster (Germany)
- Department of Applied Physics, Helsinki University of Technology, P.O. Box 1100, Helsinki 02015 (Finland)
We compare the three-dimensional force field obtained from frequency-distance measurements above the NaCl(001) surface to atomistic calculations using various tip models. In the experiments, long-range forces cause a total attractive force even on the similarly charged site. Taking force differences between two sites minimizes the influence of such long-range forces. The magnitude of the measured force differences are by a factor of 6.5-10 smaller than the calculated forces. This is an indication that for the particular tip used in this experiment several atoms of the tip interact with the surface atoms at close tip-sample distances. The interaction of these additional atoms with the surface is small at the imaging distance, because symmetric images are obtained. The force distance characteristics resemble those of a negative tip apex ion which could be explained, e.g., by a neutral Si tip.
- OSTI ID:
- 21287071
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 80, Issue 11; Other Information: DOI: 10.1103/PhysRevB.80.115426; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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