Site-specific force-distance characteristics on NaCl(001): Measurements versus atomistic simulations

Journal Article · Fri Dec 15 00:00:00 EST 2006 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PHYSREVB.74.245426· OSTI ID:20853986

Lantz, M A; Hoffmann, R; Hidber, H R ^[1]; Foster, A S ^[2]; Baratoff, A; Hug, H J; Guentherodt, H -J ^[1]

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1. Institute of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland)
2. Laboratory of Physics, Helsinki University of Technology, P.O. Box 1100, 02015 HUT (Finland)

A scanning force microscope was used to measure the frequency shift above various atomic sites on a NaCl(001) surface at 7 K. The data was converted to force and compared to the results of atomistic simulations using model NaCl and MgO tips. We find that the NaCl tip demonstrates better agreement in the magnitude of the forces in experiments, supporting the observation that the tip first came into contact with the sample. Using the MgO tip as a model of the originally oxidized silicon tip, we further demonstrate a possible mechanism for tip contamination at low temperatures.

• OSTI ID: 20853986
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Vol. 74, Issue 24; Other Information: DOI: 10.1103/PhysRevB.74.245426; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMIC FORCE MICROSCOPY
COMPUTERIZED SIMULATION
INTERACTION RANGE
MAGNESIUM OXIDES
SILICON
SODIUM CHLORIDES
SURFACES
TEMPERATURE DEPENDENCE