Measurement and modeling of pulsed microchannel plate operation (invited)

Journal Article · Wed Oct 15 04:00:00 EDT 2008 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2965787· OSTI ID:21266564

Rochau, G A; Bailey, J; Nielsen, D ^[1]; Wu, M; Kruschwitz, C; Joseph, N; Moy, K; Krane, M; Thomas, R; Tibbitts, A ^[2]

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1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
2. National Security Technologies, Las Vegas, Nevada 89193 (United States)

Microchannel plates (MCPs) are a standard detector for fast-framing x-ray imaging and spectroscopy of high-temperature plasmas. The MCP is coated with conductive striplines that carry short duration voltage pulses to control the timing and amplitude of the signal gain. This gain depends on the voltage to a large exponent so that small reflections or impedance losses along the striplines can have a significant impact on the position-dependent amplitude and pulse width of the gain. Understanding the pulsed gain response therefore requires careful measurements of the position- and time-dependent surface voltage coupled with detailed modeling of the resulting electron cascade. We present measurements and modeling of the time- and space-dependent gain response of MCP detectors designed for use at Sandia National Laboratories' Z facility. The pulsed gain response is understood through measurements using a high impedence probe to determine the voltage pulse propagating along the stripline surface. Coupling the surface voltage measurements with Monte Carlo calculations of the electron cascade in the MCP provides a prediction of the time- and position-dependent gain that agrees with measurements made on a subpicosecond UV laser source to within the 25% uncertainty in the simulations.

• OSTI ID: 21266564
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 79; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMPLITUDES
ELECTRIC POTENTIAL
ELECTRONS
GAIN
HOT PLASMA
MICROCHANNEL ELECTRON MULTIPLIERS
MONTE CARLO METHOD
POSITION SENSITIVE DETECTORS
PULSES
SANDIA NATIONAL LABORATORIES
SIMULATION
TIME DEPENDENCE
X RADIATION