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Title: Characterization of strontium barium niobate optical thin film grown by pulsed laser deposition

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.1302024· OSTI ID:21207670
; ;  [1]; ;  [2]
  1. Department of Physics, University of Puerto Rico, Mayaguez, 00681 (Puerto Rico)
  2. Chemistry Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Optical quality thin films of strontium barium niobate Sr{sub x}Ba{sub 1-x}Nb{sub 2}O{sub 6} either undoped or Eu{sup 3+}-doped has been successfully grown on fused quartz substrates using pulsed laser deposition (PLD) technique. The optical properties were characterized in either time domain or in frequency domain. Undoped SBN thin films show a broad-band emission at UV, extending to the visible, which attributes to the exciton luminescence of the SBN host in the film. High-resolution nonlinear optical response in the picosecond region, as well as the third-order susceptibility were characterized by degenerate four-wave-mixing (DFWM) measurements. A considerable enhancement, by 2 orders of magnitude, of the third order nonlinear susceptibility {chi}{sup (3)} in transverse alignment was observed with respect to the bulk values. Eu{sup 3+}-doped SBN films show a significant change in optical properties with annealing process. The fine structure of {sup 5}D{sub 0} to {sup 7}F multiplet emission was well resolved in the annealed sample. In a hole-burning experiment, a hole of width 100 MHz with depth as high as 30% was burnt using laser pumping at 5774 A. It is suggested that Eu{sup 3+} ions may substitute Nb, occupying 6-fold sites.

OSTI ID:
21207670
Journal Information:
AIP Conference Proceedings, Vol. 497, Issue 1; Conference: 9. international symposium on nondestructive characterization of materials, Sydney (Australia), 28 Jun - 2 Jul 1999; Other Information: DOI: 10.1063/1.1302024; (c) 1999 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English