Effects of oxygen on low-temperature growth and band alignment of ZnO/GaN heterostructures
- Institute of Materials Research and Engineering (IMRE), 3 Research Link, Singapore 117602 (Singapore)
Continuous ZnO thin films have been grown at low temperature (400 deg. C) on GaN/c-sapphire substrates in a radio-frequency magnetron-sputtering chamber employing a substoichiometric ZnO target with and without extra oxygen feeding. The effects of oxygen on the growth and band alignment of the ZnO/GaN heterostructures were investigated by using scanning-electron microscopy, x-ray diffraction, photoluminescence and transmittance/absorbance, ultraviolet-resonant Raman scattering, and x-ray photoelectron spectroscopy. Very remarkable changes of the structural and optical properties resulted from the introduction of oxygen: the surface hexahedral facets were diminished; the size of the surface islands and, hence, the compressive strains were reduced; ultraviolet transparency of the ZnO film was enhanced, together with an increased band gap due to the reduced intrinsic shallow-donor defects; and hence, the free-electron concentration. The offset in valence bands of the ZnO/GaN heterostructure was increased by {approx}90 meV at certain conditions. This is likely due to the increased Ga-O bonds at the ZnO/GaN interface by the incorporation of extra oxygen at the initial growth of ZnO.
- OSTI ID:
- 21192518
- Journal Information:
- Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films, Vol. 26, Issue 6; Other Information: DOI: 10.1116/1.2990853; (c) 2008 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1553-1813
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ALIGNMENT
ELECTRONS
GALLIUM NITRIDES
HETEROJUNCTIONS
LIGHT TRANSMISSION
MAGNETRONS
OPACITY
OXYGEN
PHOTOLUMINESCENCE
RADIOWAVE RADIATION
SAPPHIRE
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
TEMPERATURE RANGE
THIN FILMS
ULTRAVIOLET RADIATION
ULTRAVIOLET SPECTRA
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY
ZINC OXIDES