Microstructural and optical analysis of superresolution phenomena due to Ge{sub 2}Sb{sub 2}Te{sub 5} thin films at blue light regime

Journal Article · Mon Dec 01 04:00:00 EST 2008 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3040695· OSTI ID:21175789

Lee, Hyun Seok ^[1]; Lee, Taek Sung; Lee, Suyoun; Cheong, Byung-ki ^[1]; Lee, Yongwoon; Kim, Jooho ^[2]; Huh, Joo-Youl; Kim, Donghwan ^[3]

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1. Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1 Hawolgok-dong, Sungbuk-ku, Seoul 136-791 (Korea, Republic of)
2. Digital Media R and D Center, Samsung Electronics Co., Ltd., 416 Maetan, 3-dong, Youngtong-gu, Suwon 442-742 (Korea, Republic of)
3. Department of Materials Science and Engineering, Korea University, 5-1 Anam-dong, Sungbuk-ku, Seoul 136-701 (Korea, Republic of)

Superresolution (SR) phenomena due to Ge{sub 2}Sb{sub 2}Te{sub 5} films were examined by combined analysis of the transmission electron microscopy (TEM) microstructures of the laser-irradiated films and the results from dynamic and static tests using blue lasers. A new finding was made that comprises a complementary case of the classical SR readout by Ge{sub 2}Sb{sub 2}Te{sub 5} film; an amorphous band instead of a closed aperture of melt in the crystalline background forms behind a moving laser but still produces a high SR signal. A complete carrier-to-noise-ratio curve of a SR-read-only memory employing Ge{sub 2}Sb{sub 2}Te{sub 5} may be derived from a nonlinear optical effect, specifically thermally assisted saturable absorption.

• OSTI ID: 21175789
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 22 Vol. 93; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ANTIMONY ALLOYS
GERMANIUM ALLOYS
LASERS
MICROSTRUCTURE
NONLINEAR PROBLEMS
TELLURIUM ALLOYS
TERNARY ALLOY SYSTEMS
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY