Effects of aging on the characteristics of TiNiPd shape memory alloy thin films
Journal Article
·
· Materials Characterization
- Key Laboratory for Thin Film and Micro-fabrication Technology of Ministry of Education, Research Institute of Micro/Nanometer Science and Technology (China)
- School of Material Science and Engineering, Shanghai Jiaotong University, 200030, Shanghai (China)
TiNiPd thin films have been deposited on glass substrate using R.F. magnetron sputtering. Effects of annealing and aging on the microstructure, phase transformation behaviors and shape memory effects of these thin films have been studied by X-ray diffractometry, differential scanning calorimeter, tensile tests and internal friction characteristics. The TiNiPd thin films annealed at 750 deg. C exhibit uniform martensite/austenite transformations and shape memory effect. Aging at 450 deg. C for 1 h improved the uniformity of transformations and shape memory effect. Long time aging decreased transformation temperatures and increased the brittleness of TiNiPd thin films.
- OSTI ID:
- 21140749
- Journal Information:
- Materials Characterization, Vol. 59, Issue 7; Other Information: DOI: 10.1016/j.matchar.2007.08.013; PII: S1044-5803(07)00292-6; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
AGING
ANNEALING
AUSTENITE
BRITTLENESS
CALORIMETERS
GLASS
INTERNAL FRICTION
MAGNETRONS
MARTENSITE
MICROSTRUCTURE
NICKEL ALLOYS
PALLADIUM ALLOYS
PHASE TRANSFORMATIONS
SPUTTERING
TEMPERATURE RANGE 0400-1000 K
TEMPERATURE RANGE 1000-4000 K
THIN FILMS
TITANIUM ALLOYS
X-RAY DIFFRACTION
AGING
ANNEALING
AUSTENITE
BRITTLENESS
CALORIMETERS
GLASS
INTERNAL FRICTION
MAGNETRONS
MARTENSITE
MICROSTRUCTURE
NICKEL ALLOYS
PALLADIUM ALLOYS
PHASE TRANSFORMATIONS
SPUTTERING
TEMPERATURE RANGE 0400-1000 K
TEMPERATURE RANGE 1000-4000 K
THIN FILMS
TITANIUM ALLOYS
X-RAY DIFFRACTION