Optical constants of magnetron-sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV

Journal Article · Mon Sep 01 04:00:00 EDT 2008 · Applied Optics

DOI:https://doi.org/10.1364/AO.47.004633· OSTI ID:21120931

Soufli, Regina; Aquila, Andrew L; Salmassi, Farhad; Fernandez-Perea, Monica; Gullikson, Eric M

This work discusses the experimental determination of the optical constants (refractive index) of DC-magnetron-sputtered boron carbide films in the 30-770 eV photon energy range. Transmittance measurements of three boron carbide films with thicknesses of 54.2, 79.0, and 112.5 nm were performed for this purpose. These are believed to be the first published experimental data for the refractive index of boron carbide films in the photon energy range above 160 eV and for the near-edge x-ray absorption fine structure regions around the boron K (188 eV), carbon K (284.2 eV), and oxygen K (543.1 eV) absorption edges. The density, composition, surface chemistry, and morphology of the films were also investigated using Rutherford backscattering, x-ray photoelectron spectroscopy, atomic force microscopy, scanning electron microscopy, and extreme ultraviolet reflectance measurements.

• OSTI ID: 21120931
• Journal Information: Applied Optics, Journal Name: Applied Optics Journal Issue: 25 Vol. 47; ISSN 0003-6935; ISSN APOPAI
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ATOMIC FORCE MICROSCOPY
BORON CARBIDES
EV RANGE 100-1000
EXTREME ULTRAVIOLET RADIATION
FINE STRUCTURE
MAGNETRONS
MORPHOLOGY
PHOTONS
REFRACTIVE INDEX
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SCANNING ELECTRON MICROSCOPY
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY