Radiation-modified structure of Ge{sub 25}Sb{sub 15}S{sub 60} and Ge{sub 35}Sb{sub 5}S{sub 60} glasses
- Institute of Materials, Scientific Research Company 'Carat', 202 Stryjska Str., Lviv 79031 (Ukraine)
- Institute of Physics, Chemnitz University of Technology, D-09107 Chemnitz (Germany)
Atomic structures of Ge{sub 25}Sb{sub 15}S{sub 60} and Ge{sub 35}Sb{sub 5}S{sub 60} glasses are investigated in the {gamma}-irradiated and annealed after {gamma}-irradiation states by means of high-energy synchrotron x-ray diffraction technique. The first sharp diffraction peak (FSDP) is detected at around 1.1 A{sup -1} in the structure factors of both alloys studied. The FSDP position is found to be stable for radiation/annealing treatment of the samples, while the FSDP intensity shows some changes between {gamma}-irradiated and annealed states. The peaks in the pair distribution functions observed between 2 and 4 A are related to the Ge-S, Ge-Sb, and Sb-Sb first neighbor correlations and Ge-Ge second neighbor correlations in the edge-shared GeS{sub 4/2} tetrahedra, and S-S and/or Ge-Ge second neighbor correlations in the corner-shared GeS{sub 4/2} tetrahedra. Three mechanisms of the radiation-/annealing-induced changes are discussed in the framework of coordination topological defect formation and bond-free solid angle concepts.
- OSTI ID:
- 21104069
- Journal Information:
- Journal of Chemical Physics, Vol. 128, Issue 24; Other Information: DOI: 10.1063/1.2945300; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-9606
- Country of Publication:
- United States
- Language:
- English
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