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Tunneling magnetoresistance of magnetic tunnel junctions using perpendicular magnetization L1{sub 0}-CoPt electrodes

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.2913163· OSTI ID:21102009
; ;  [1];  [2];  [3]
  1. Department of Applied Physics, Graduate School of Engineering, Tohoku University, Aoba-yama 6-6-05, Sendai 980-8579 (Japan)
  2. Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan)
  3. New Industry Creation Hatchery Center, Tohoku University, Aoba-yama 6-6-10, Sendai 980-8579 (Japan)
Magnetic tunnel junctions (MTJs) using L1{sub 0}-ordered CoPt electrodes with perpendicular magnetic anisotropy were fabricated. Full-epitaxial CoPt/MgO/CoPt-MTJs were prepared onto single crystal MgO-(001) substrate by sputtering method. X-ray diffraction analyses revealed that both bottom and top CoPt electrodes were epitaxially grown with (001)-orientation. The L1{sub 0}-chemical order parameter of 0.82 was obtained for the bottom CoPt electrode deposited at substrate temperature of 600 deg. C. The transport measurements with applying magnetic field perpendicular to the film plane showed a tunnel magnetoresistance ratio of 6% at room temperature and 13% at 10 K.
OSTI ID:
21102009
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 17 Vol. 92; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English