Formation conditions and temperature dependence of forbidden reflections during resonant X-ray diffraction in zinc oxide single crystals

Journal Article · Sun Jul 15 04:00:00 EDT 2007 · Crystallography Reports

DOI:https://doi.org/10.1134/S1063774507040062· OSTI ID:21090890

Dmitrienko, V E ^[1]; Collins, S ^[2]; Ovchinnikova, E N ^[3]; Oreshko, A P ^[1]

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1. Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)
2. Rutherford Appleton Laboratory, Diamond Light Source (United Kingdom)
3. Moscow State University (Russian Federation)

Different mechanisms of formation of purely resonant reflections hhl (h = 2n + 1) during resonant diffraction of X-ray synchrotron radiation in zinc oxide, whose intensity very strongly changes with an increase in temperature, are considered. Such reflections, forbidden in the dipole-dipole scattering, can be excited owing to the dipole-quadrupole scattering and the anisotropy of X-ray susceptibility induced by thermal motion of atoms and point defects. Different contributions are theoretically considered and it is shown that they can be separated owing to their different temperature dependences.

• OSTI ID: 21090890
• Journal Information: Crystallography Reports, Journal Name: Crystallography Reports Journal Issue: 4 Vol. 52; ISSN 1063-7745; ISSN CYSTE3
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANISOTROPY
DIPOLES
MONOCRYSTALS
POINT DEFECTS
REFLECTION
SYNCHROTRON RADIATION
TEMPERATURE DEPENDENCE
X RADIATION
X-RAY DIFFRACTION
ZINC OXIDES