Effect of B{sub 2}O{sub 3}-Bi{sub 2}O{sub 3}-SiO{sub 2}-ZnO glass on the sintering and microwave dielectric properties of 0.83ZnAl{sub 2}O{sub 4}-0.17TiO{sub 2}

Journal Article · Tue Apr 01 00:00:00 EDT 2008 · Materials Research Bulletin

DOI:https://doi.org/10.1016/j.materresbull.2007.05.015· OSTI ID:21068236

Thomas, Sherin ^[1]

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1. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology, Trivandrum 695019 (India)

The 0.83ZnAl{sub 2}O{sub 4}-0.17TiO{sub 2} (ZAT) ceramics were synthesized by solid state ceramic route. The effect of 27B{sub 2}O{sub 3}-35Bi{sub 2}O{sub 3}-6SiO{sub 2}-32ZnO (BBSZ) glass on the microwave dielectric properties of ZAT was investigated. The crystal structure and the microstructure of the ceramic-glass composites were studied by X-ray diffraction and scanning electron microscopic techniques. The low frequency dielectric loss was measured at 1 MHz. The dielectric properties of the sintered samples were measured in the microwave frequency range by the resonance method. Addition of 0.2 wt% of BBSZ improved the dielectric properties with quality factor (Q{sub u} x f) > 120,000 GHz, temperature coefficient of resonant frequency ({tau}{sub f}) = -7.3 ppm/deg. C and dielectric constant ({epsilon}{sub r}) = 11.7. Addition of 10 wt% of BBSZ lowered the sintering temperature to about 950 deg. C with Q{sub u} x f > 10,000 GHz, {epsilon}{sub r} = 10 and {tau}{sub f} = -23 ppm/deg. C. The reactivity of 10 wt% BBSZ added ZAT with silver was also studied. The results show that ZAT doped with suitable amount of BBSZ glass is a possible material for low-temperature co-fired ceramic (LTCC) application.

• OSTI ID: 21068236
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 4 Vol. 43; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BISMUTH OXIDES
BORON OXIDES
CERAMICS
CRYSTAL STRUCTURE
DIELECTRIC MATERIALS
DOPED MATERIALS
GHZ RANGE 100-1000
GLASS
MHZ RANGE 01-100
MICROSTRUCTURE
MICROWAVE RADIATION
PERMITTIVITY
QUALITY FACTOR
REACTIVITY
SCANNING ELECTRON MICROSCOPY
SILICA
SILICON OXIDES
SILVER
SINTERING
TEMPERATURE COEFFICIENT
X-RAY DIFFRACTION
ZINC OXIDES