Polychromatic X-ray Micro- and Nano-Beam Science and Instrumentation

Journal Article · Fri Jan 19 04:00:00 EST 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2436302· OSTI ID:21049263

Ice, G E; Larson, B C; Liu, W; Barabash, R I; Specht, E D; Pang, J W. L.; Budai, J D; Tischler, J Z ^[1]; Khounsary, A; Liu, C; Macrander, A T; Assoufid, L ^[2]

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1. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge TN 37831-6118 (United States)
2. Advanced Photon Source, Argonne National Laboratory, 9700 S. Cass Ave. Argonne Il 60439 (United States)

Polychromatic x-ray micro- and nano-beam diffraction is an emerging nondestructive tool for the study of local crystalline structure and defect distributions. Both long-standing fundamental materials science issues, and technologically important questions about specific materials systems can be uniquely addressed. Spatial resolution is determined by the beam size at the sample and by a knife-edge technique called differential aperture microscopy that decodes the origin of scattering from along the penetrating x-ray beam. First-generation instrumentation on station 34-ID-E at the Advanced Photon Source (APS) allows for nondestructive automated recovery of the three-dimensional (3D) local crystal phase and orientation. Also recovered are the local elastic-strain and the dislocation tensor distributions. New instrumentation now under development will further extend the applications of polychromatic microdiffraction and will revolutionize materials characterization.

• OSTI ID: 21049263
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 879; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADVANCED PHOTON SOURCE
APERTURES
CRYSTALS
DISLOCATIONS
DISTRIBUTION
MICROSCOPY
ORIENTATION
PHOTON BEAMS
SPATIAL RESOLUTION
STRAINS
TENSORS
THREE-DIMENSIONAL CALCULATIONS
X RADIATION
X-RAY DIFFRACTION