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Title: Thermoelectric properties of Cu-doped n-type (Bi{sub 2}Te{sub 3}){sub 0.9}-(Bi{sub 2-x}Cu{sub x}Se{sub 3}){sub 0.1}(x=0-0.2) alloys

Journal Article · · Journal of Solid State Chemistry
 [1]; ;  [2]; ;  [3]
  1. College of Chemical Engineering and Materials Science, Zhejiang University of Technology, Hangzhou 310014 (China)
  2. School of Mechanical Engineering, Ningbo University of Technology, Ningbo 315016 (China)
  3. School of Materials Science and Engineering, China University of Mining and Technology, Xuzhou 221008 (China)

n-Type (Bi{sub 2}Te{sub 3}){sub 0.9}-(Bi{sub 2-x}Cu{sub x}Se{sub 3}){sub 0.1} (x=0-0.2) alloys with Cu substitution for Bi were prepared by spark plasma-sintering technique and their structural and thermoelectric properties were evaluated. Rietveld analysis reveals that approximate 9.0% of Bi atomic sites are occupied by Cu atoms and less than 4.0 wt% second phase Cu{sub 2.86}Te{sub 2} precipitated in the Cu-doped parent alloys. Measurements show that an introduction of a small amount of Cu (x{<=}0.1) can reduce the lattice thermal conductivity ({kappa}{sub L}), and improve the electrical conductivity and Seebeck coefficient. An optimal dimensionless figure of merit (ZT) value of 0.98 is obtained for x=0.1 at 417 K, which is obviously higher than those of Cu-free Bi{sub 2}Se{sub 0.3}Te{sub 2.7} (ZT=0.66) and Ag-doped alloys (ZT=0.86) prepared by the same technologies. - Graphical abstract: After Cu-doping with x=0.1, the highest ZT value of 0.98 is obtained at 417 K, which is about 0.32 and 0.12 higher than those of Cu-free Bi{sub 2}Se{sub 0.3}Te{sub 2.7} and the Ag-doped alloys (Bi{sub 2}Te{sub 3}){sub 0.9}-(Bi{sub 2-x}Ag{sub x}Se{sub 3}){sub 0.1} (x=0.4), respectively.

OSTI ID:
21043791
Journal Information:
Journal of Solid State Chemistry, Vol. 180, Issue 12; Other Information: DOI: 10.1016/j.jssc.2007.10.013; PII: S0022-4596(07)00427-6; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English