Laser ablation loading of a surface-electrode ion trap

Journal Article · Thu Nov 15 04:00:00 EST 2007 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.76.055403· OSTI ID:21028115

Leibrandt, David R; Clark, Robert J; Labaziewicz, Jaroslaw; Antohi, Paul; Bakr, Waseem; Brown, Kenneth R; Chuang, Isaac L ^[1]

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1. Center for Ultracold Atoms, Research Laboratory of Electronics and Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

We demonstrate loading of {sup 88}Sr{sup +} ions by laser ablation into a mm-scale surface-electrode ion trap. The laser used for ablation is a pulsed, frequency-tripled Nd:YAG with pulse energies of 1-10 mJ and durations of 4 ns. An additional laser is not required to photoionize the ablated material. The efficiency and lifetime of several candidate materials for the laser ablation target are characterized by measuring the trapped ion fluorescence signal for a number of consecutive loads. Additionally, laser ablation is used to load traps with a trap depth (40 meV) below where electron impact ionization loading is typically successful (> or approx. 500 meV)

• OSTI ID: 21028115
• Journal Information: Physical Review. A, Journal Name: Physical Review. A Journal Issue: 5 Vol. 76; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
ABLATION
CATIONS
EFFICIENCY
ELECTRODES
ELECTRONS
FLUORESCENCE
LIFETIME
PARTICLES
PHOTOIONIZATION
PULSES
STRONTIUM 88
STRONTIUM IONS
SURFACES
TRAPPING
TRAPS