Preparation and characterization of amorphous manganese sulfide thin films by SILAR method

Journal Article · Tue Aug 07 04:00:00 EDT 2007 · Materials Research Bulletin

DOI:https://doi.org/10.1016/j.materresbull.2006.11.017· OSTI ID:21000694

Pathan, H M ^[1]; Kale, S S ^[2]; Lokhande, C D ^[3]; Han, Sung-Hwan ^[2]; Joo, Oh-Shim ^[1]

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1. Eco-Nano Research Center, Korea Institute of Science and Technology, P.O. Box 131, Cheongryang, Seoul 130-650 (Korea, Republic of)
2. Department of Chemistry, Hanyang University, Sungdong-Ku, Haengdang-dong, 17, Seoul 133-791 (Korea, Republic of)
3. Thin Film Physics Laboratory, Department of Physics, Shivaji University, Kolhapur 416004 (India)

Manganese sulfide thin films were deposited by a simple and inexpensive successive ionic layer adsorption and reaction (SILAR) method using manganese acetate as a manganese and sodium sulfide as sulfide ion sources, respectively. Manganese sulfide films were characterized for their structural, surface morphological and optical properties by means of X-ray diffraction, scanning electron microscopy, energy dispersive X-ray analysis and optical absorption measurement techniques. The as-deposited film on glass substrate was amorphous. The optical band gap of the film was found to be thickness dependent. As thickness increases optical band gap was found to be increase. The water angle contact was found to be 34{sup o}, suggesting hydrophilic nature of manganese sulfide thin films. The presence of Mn and S in thin film was confirmed by energy dispersive X-ray analysis.

• OSTI ID: 21000694
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Journal Issue: 8 Vol. 42; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ACETATES
ADSORPTION
GLASS
ION SOURCES
MANGANESE
MANGANESE SULFIDES
OPTICAL PROPERTIES
SCANNING ELECTRON MICROSCOPY
SODIUM SULFIDES
SURFACE PROPERTIES
THICKNESS
THIN FILMS
X RADIATION
X-RAY DIFFRACTION