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Atomic data and spectral line intensities for Mg IX

Journal Article · · Atomic Data and Nuclear Data Tables
 [1];  [2]
  1. NASA/Goddard Space Flight Center, Greenbelt, MD 20771 (United States)
  2. ARTEP, Inc., Columbia, MD 21044 (United States) and Naval Research Laboratory, Washington, DC 20375 (United States)
Electron impact collision strengths, energy levels, oscillator strengths, and spontaneous radiative decay rates are calculated for Mg IX. The configurations used are 2s{sup 2}, 2s2p, 2p{sup 2}, 2l3l', 2l4l' and 2s5l', with l = s, p and l' = s, p, d giving rise to 92 fine-structure levels in intermediate coupling. Collision strengths are calculated at seven incident energies (6, 12, 25, 50, 75, 100, and 125 Ry) for the transitions within the three lowest configurations, and five incident energies (25, 50, 75, 100, and 125 Ry) for transitions between the ground configuration and the n = 3, 4, 5 configurations. Calculations have been carried out using the distorted wave approximation. Excitation rate coefficients are calculated as a function of electron temperature by assuming a Maxwellian electron velocity distribution. Using the excitation rate coefficients and the radiative transition rates of the present work, and R-Matrix results for the 2s{sup 2}, 2s2p, 2p{sup 2} configurations available in the literature, statistical equilibrium equations for level populations are solved at electron densities covering the range of 10{sup 8}-10{sup 14} cm{sup -3} at an electron temperature of log T {sub e} (K) = 6.0, corresponding to the maximum abundance of Mg IX. Spectral line intensities are calculated, and their diagnostic relevance is discussed. Observed line ratios indicate electron temperatures of the emitting plasma which agree with log T {sub e} (K) = 6.0. This dataset will be made available in the next version of the CHIANTI database.
OSTI ID:
20976813
Journal Information:
Atomic Data and Nuclear Data Tables, Journal Name: Atomic Data and Nuclear Data Tables Journal Issue: 5 Vol. 93; ISSN ADNDAT; ISSN 0092-640X
Country of Publication:
United States
Language:
English

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