Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Journal Article · Fri Jun 15 04:00:00 EDT 2007 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2748674· OSTI ID:20953463

Dunham, Greg; Bailey, J E; Rochau, G A; Lake, P W; Nielsen-Weber, L B ^[1]

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1. Ktech Corporation, 1300 Eubank Boulevard, SE Albuquerque, New Mexico 87123 (United States)

Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. This large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented.

• OSTI ID: 20953463
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 6 Vol. 78; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
NOISE
RANDOMNESS
SANDIA NATIONAL LABORATORIES
STATISTICS
WIDTH
X-RAY DETECTION
X-RAY SPECTRA
X-RAY SPECTROMETERS