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Title: Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Abstract

Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. Also, this large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented in this paper.

Authors:
 [1];  [2];  [2];  [2];  [1]
  1. Ktech Corp., Albuquerque, NM (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1427012
Report Number(s):
SAND2007-0241J
Journal ID: ISSN 0034-6748; 524295
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 78; Journal Issue: 6; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; x-ray spectra; luminescence; phosphors; photoluminescence; optical imaging; spatial resolution; optical metrology; plasma confinement; plasma devices; electromagnetic radiation detectors

Citation Formats

Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., and Nielsen-Weber, L. B. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors. United States: N. p., 2007. Web. doi:10.1063/1.2748674.
Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., & Nielsen-Weber, L. B. Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors. United States. https://doi.org/10.1063/1.2748674
Dunham, Greg, Bailey, J. E., Rochau, G. A., Lake, P. W., and Nielsen-Weber, L. B. Wed . "Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors". United States. https://doi.org/10.1063/1.2748674. https://www.osti.gov/servlets/purl/1427012.
@article{osti_1427012,
title = {Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors},
author = {Dunham, Greg and Bailey, J. E. and Rochau, G. A. and Lake, P. W. and Nielsen-Weber, L. B.},
abstractNote = {Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. Also, this large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented in this paper.},
doi = {10.1063/1.2748674},
url = {https://www.osti.gov/biblio/1427012}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 6,
volume = 78,
place = {United States},
year = {2007},
month = {6}
}

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Cited by: 5 works
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Works referenced in this record:

Dynamic hohlraum driven inertial fusion capsules
journal, May 2003


Dynamic hohlraum radiation hydrodynamics
journal, May 2006


Hot Dense Capsule-Implosion Cores Produced by Z -Pinch Dynamic Hohlraum Radiation
journal, February 2004


Twin-elliptical-crystal time- and space-resolved soft x-ray spectrometer
journal, October 2006


X-ray imaging of targets irradiated by the Nike KrF laser
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Measurements of the counting statistics on RAR-2497 and DEF x-ray film
journal, October 2004


Energy dependent sensitivity of microchannel plate detectors
journal, October 2006


Measurement and analysis of x-ray absorption in Al and MgF 2 plasmas heated by Z -pinch radiation
journal, December 2005


High speed proximity focused X-ray cameras
journal, March 1991


Time- and space-resolved elliptical crystal spectrometers for high energy density physics research
journal, October 2004


    Works referencing / citing this record:

    Diagnosis of x-ray heated Mg/Fe opacity research plasmas
    journal, November 2008