Response model for Kodak Biomax-MS film to x rays

Journal Article · Sun Oct 15 00:00:00 EDT 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2220046· OSTI ID:20861361

Knauer, J P; Marshall, F J; Yaakobi, B; Anderson, D; Schmitt, B A; Chandler, K M; Pikuz, S A; Shelkovenko, T A; Mitchell, M D; Hammer, D A ^[1]

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1. Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623 (United States)

X-ray-sensitive film is used for a variety of imaging and spectroscopic diagnostics for high-temperature plasmas. Replacement film must be found as older films are phased out of production. Biomax-MS is a 'T-grain' class of film that is proposed as a replacement for Kodak DEF and a model of its response to x rays is presented. Data from dimensional measurements of the film, x-ray transmission measurements, scanning electron microscopy micrograph images, and x-ray calibration are used to develop this sensitivity model of Biomax-MS film as a function of x-ray energy and angle of incidence. Relative response data provide a check of the applicability of this model to determine the x-ray flux from spectrum data. This detailed film characterization starts with simple mathematical models and extends them to T-grain-type film.

• OSTI ID: 20861361
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 10; Other Information: DOI: 10.1063/1.2220046; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
CALIBRATION
HOT PLASMA
IMAGES
INCIDENCE ANGLE
MATHEMATICAL MODELS
PHOTOGRAPHIC EMULSIONS
PLASMA DIAGNOSTICS
SCANNING ELECTRON MICROSCOPY
SENSITIVITY
THIN FILMS
X RADIATION
X-RAY SPECTROSCOPY