Depleted uranium ({sub 92}U{sup 238}) induced preionization for enhanced and reproducible x-ray emission from plasma focus

Journal Article · Mon Aug 07 00:00:00 EDT 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2244055· OSTI ID:20860665

Ahmad, S; Shafiq, M; Zakaullah, M; Waheed, A ^[1]

---

1. Department of Physics, Quaid-i-Azam University, 45320 Islamabad (Pakistan)

The effect of preionization induced by depleted uranium ({sub 92}U{sup 238}) around the insulator sleeve on the x-ray emission of (2.3-3.9 kJ) plasma focus device is investigated by employing Quantrad Si p-i-n diodes and a multipinhole camera. X-ray emission in 4{pi} geometry is measured as a function of charging voltage with and without preionization. It is found that the preionization enhances Cu K{alpha} and total x-ray yield about 100%, broadens the x-ray emission pressure range and x-ray pulse width, and improves shot to shot reproducibility of plasma focus operation. The pinhole images of x-ray emitting zones indicate that dominant x-ray emission is from the anode tip.

• OSTI ID: 20860665
• Journal Information: Applied Physics Letters, Vol. 89, Issue 6; Other Information: DOI: 10.1063/1.2244055; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ANODES
DEPLETED URANIUM
ELECTRIC POTENTIAL
PHOTON EMISSION
PINCH EFFECT
PLASMA
PLASMA DIAGNOSTICS
PLASMA FOCUS
PLASMA FOCUS DEVICES
PULSES
SLEEVES
URANIUM 238
X RADIATION
X-RAY SOURCES