Fragmentation processes of C{sub 60} in multiple electron loss and capture collisions of 2-MeV Si{sup 2+}

Journal Article · Fri Sep 15 04:00:00 EDT 2006 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.74.033201· OSTI ID:20857713

Majima, T; Mizuno, T; Tsuchida, H; Itoh, A ^[1]; Nakai, Y ^[2]

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1. Quantum Science and Engineering Center, Kyoto University, Kyoto 606-8501 (Japan)
2. RIKEN - Institute of Physical and Chemical Research, Wako, Saitama 351-0198 (Japan)

An experimental study of ionization and fragmentation of C{sub 60} has been performed for 2-MeV Si{sup 2+} incident ions under charge-changing conditions. Time-of-flight (TOF) spectra of product ions and number distributions of secondary electrons (n{sub e}) were measured in coincidence with charge-selected outgoing projectiles. TOF spectra from transiently formed highly charged C{sub 60}{sup r+} ions are obtained for individual charge states r, and n{sub e} distributions correlated with size-fixed C{sub m}{sup +} ions are also obtained for m<15. It is found that mass spectra and n{sub e} distributions are both significantly different between loss and capture collisions, whereas a remarkable similarity in the partial n{sub e} distributions is observed almost independently of the different charge-changing conditions when compared at given C{sub m}{sup +} ions size. We find also that a number of secondary electrons as high as 20 are emitted in the production of small fragment ions. Furthermore, small fragment ions are produced predominantly in close collisions even at very low charge states of r{approx_equal}3 in comparison with distant collisions. This indicates that the energy partition rate between ionization and internal excitation might be considerably different in close and distant collisions.

• OSTI ID: 20857713
• Journal Information: Physical Review. A, Journal Name: Physical Review. A Journal Issue: 3 Vol. 74; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
CATIONS
CHARGE STATES
COMPARATIVE EVALUATIONS
DISSOCIATION
DISTRIBUTION
ELECTRON CAPTURE
ELECTRON EMISSION
ELECTRONS
EXCITATION
FULLERENES
ION-MOLECULE COLLISIONS
IONIZATION
MASS SPECTRA
MEV RANGE
PARTITION
SILICON IONS
TIME-OF-FLIGHT METHOD