Correlation between multiple ionization and fragmentation of C{sub 60} in 2-MeV Si{sup 2+} collisions: Evidence for fragmentation induced by internal excitation

Journal Article · Mon Mar 01 04:00:00 EST 2004 · Physical Review. A

DOI:https://doi.org/10.1103/PhysRevA.69.031202· OSTI ID:20640804

Majima, T; Tsuchida, H; Itoh, A ^[1]; Nakai, Y ^[2]

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1. Quantum Science and Engineering Center, Kyoto University, Kyoto 606-8501 (Japan)
2. RIKEN - Institute of Physical and Chemical Research, Wako, Saitama 351-0198 (Japan)

Fragment ions from C{sub 60} induced by 2 MeV (v=1.7 a.u.) Si{sup 2+} impacts are measured in coincidence with the number distributions of secondary electrons under conditions of single-electron loss and single-electron capture collisions. Multifragmentation, leading to disintegration of cage structure, is found to occur at surprisingly low charge states of r{approx_equal}3. Also, we find that mass distributions of fragment ions are nearly the same for loss and capture collisions provided that the number of electrons ejected, due to electronic energy deposition from an incident ion, are the same. Present results indicate evidently that the internal excitation, rather than the charge state r of transiently formed prefragmented parent ions C{sub 60}{sup r+}**, plays the essential role in C{sub 60} fragmentation in fast heavy ion collisions.

• OSTI ID: 20640804
• Journal Information: Physical Review. A, Journal Name: Physical Review. A Journal Issue: 3 Vol. 69; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
CATIONS
CHARGE STATES
CORRELATIONS
DISSOCIATION
ELECTRON CAPTURE
ELECTRON LOSS
ELECTRONS
EXCITATION
FULLERENES
HEAVY ION REACTIONS
ION-MOLECULE COLLISIONS
IONIZATION
MASS DISTRIBUTION
MEV RANGE
SILICON
SILICON IONS
TIME-OF-FLIGHT METHOD