X-ray resonant magnetic scattering study of magnetic stripe domains in a-GdFe thin films

Journal Article · Fri Sep 01 00:00:00 EDT 2006 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PHYSREVB.74.094437· OSTI ID:20853638

Miguel, J; Peters, J F; Toulemonde, O M; Goedkoop, J B ^[1]; Dhesi, S S; Brookes, N B ^[2]

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1. Van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat 65, 1018 XE, Amsterdam (Netherlands)
2. European Synchrotron Radiation Facility, ESRF, Boite Postale 220, F-38043 Grenoble Cedex (France)

X-ray resonant magnetic scattering (XRMS) has been used to investigate the structure of magnetic stripe domain patterns in thin amorphous GdFe films. Under the influence of a perpendicular magnetic field, the scattered intensity displays a smooth transition from a structure factor of correlated stripes to the form factor of isolated domains. We derive a quite general expression that relates the total scattered intensity of XRMS to the absolute value of the magnetization. Furthermore, we compare our results for the domain period with domain theory. We obtain good agreement for prealigned stripes, but disorder tends to lead to an overestimation of the period measured with XRMS.

• OSTI ID: 20853638
• Journal Information: Physical Review. B, Condensed Matter and Materials Physics, Vol. 74, Issue 9; Other Information: DOI: 10.1103/PhysRevB.74.094437; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COMPARATIVE EVALUATIONS
FORM FACTORS
GADOLINIUM ALLOYS
IRON ALLOYS
MAGNETIC FIELDS
MAGNETIZATION
METALLIC GLASSES
STRUCTURE FACTORS
THIN FILMS
X RADIATION
X-RAY DIFFRACTION