New evaluation technique for thin-film solar cell back-reflector using photothermal deflection spectroscopy
- Energy Conversion Devices, Inc., Troy, MI (United States)
The authors report a new technique to determine the optical loss of a thin-film solar cell back-reflector using Photothermal Deflection Spectroscopy (PDS). They modified a conventional PDS technique to measure the reflection loss of highly reflective and highly textured back reflector surfaces. PDS has demonstrated its advantages in such measurements because, unlike conventional reflectance measurements, it measures the fraction of the light that is converted to heat. The authors then used this technique for developing new back-reflectors. They developed a Hot-Ag/Cold-Ag two-layer system in which the texture is provided by the bottom Ag layer deposited at high temperature and low deposition rate, and the reflectance is provided by the top Ag layer deposited at low temperature and high deposition rate. Such a highly reflective and highly textured back-reflector system enhanced the quantum efficiency (QE) of a-Si solar cells both in the red and in the blue regions.
- OSTI ID:
- 208125
- Report Number(s):
- CONF-941203-; ISBN 0-7803-1459-X; TRN: IM9616%%453
- Resource Relation:
- Conference: 1. world conference on photovoltaic energy conversion, Waikoloa, HI (United States), 5-9 Dec 1994; Other Information: PBD: 1994; Related Information: Is Part Of 1994 IEEE first world conference on photovoltaic energy conversion: Conference record of the twenty fourth IEEE photovoltaic specialists conference -- 1994. Volume 1; PB: 1303 p.
- Country of Publication:
- United States
- Language:
- English
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