Localized spin-wave excitation by the evanescent microwave scanning probe

Journal Article · Wed Feb 15 00:00:00 EST 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2167131· OSTI ID:20778742

Sakran, F; Golosovsky, M; Davidov, D; Monod, P ^[1]

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1. Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem 91904 (Israel)

We report a technique for the local contactless spin-wave excitation using the evanescent microwave scanning probe. Our probe is based on a dielectric resonator with the thin slit aperture. It operates at 8.8 GHz, has a spatial resolution of 10-100 {mu}m, and may be operated in the parallel and in the perpendicular magnetic field. The measurements can be performed in contact mode or by scanning the sample at constant probe-sample separation. Using 120-150 nm thick Permalloy films on a glass substrate as test samples, we show how our technique can be used for thickness measurements of thin magnetic films and for the mapping of their magnetic properties, such as magnetization and surface anisotropy.

• OSTI ID: 20778742
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 2; Other Information: DOI: 10.1063/1.2167131; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANISOTROPY
APERTURES
DIELECTRIC MATERIALS
GHZ RANGE 01-100
MAGNETIC FIELDS
MAGNETIC PROPERTIES
MEASURING METHODS
MICROWAVE RADIATION
PERMALLOY
PROBES
RESONATORS
SPATIAL RESOLUTION
SPIN WAVES
THICKNESS
THIN FILMS