Nanometer Linear Focusing of Hard X Rays by a Multilayer Laue Lens

Journal Article · Fri Mar 31 00:00:00 EST 2006 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.96.127401· OSTI ID:20777126

Kang, H C; Stephenson, G B ^[1]; Maser, J ^[1]; Liu, C; Conley, R; Macrander, A T; Vogt, S ^[2]

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1. Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. Experimental Facilities Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

We report on a type of linear zone plate for nanometer-scale focusing of hard x rays, a multilayer Laue lens (MLL), produced by sectioning a multilayer and illuminating it in Laue diffraction geometry. Because of its large optical depth, a MLL spans the diffraction regimes applicable to a thin Fresnel zone plate and a crystal. Coupled wave theory calculations indicate that focusing to 5 nm or smaller with high efficiency should be possible. Partial MLL structures with outermost zone widths as small as 10 nm have been fabricated and tested with 19.5 keV synchrotron radiation. Focal sizes as small as 30 nm with efficiencies up to 44% are measured.

• OSTI ID: 20777126
• Journal Information: Physical Review Letters, Vol. 96, Issue 12; Other Information: DOI: 10.1103/PhysRevLett.96.127401; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BEAM OPTICS
CRYSTALS
DIFFRACTION
EFFICIENCY
FOCUSING
GEOMETRY
HARD X RADIATION
KEV RANGE 10-100
LENSES
PLATES
SYNCHROTRON RADIATION