Application of machine learning for optical emission spectroscopy data in NAGDIS-II
Journal Article
·
· Fusion Engineering and Design
- University of Tokyo, Chiba (Japan)
- Nagoya University (Japan)
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
In this study, we applied machine learning to optical emission spectroscopy (OES) data and device parameters from the linear plasma device NAGDIS-II to explore the potential application of machine learning for predicting electron density, $$n$$e, and temperature, $$T$$e. The covered ranges of $$n$$e and $$T$$e, which were measured by an electrostatic probe, are 3.6 × 1017–2.4 × 1019 m-3 and 0.3–7.1 eV, respectively. A three hidden layer neural network (NN) is introduced to model the relationship between $$n$$e/$$T$$e and the combination of line intensities, radial position, and device parameters. It is shown that the errors in $$n$$e and $$T$$e become 18.0 and 18.8%, respectively, which were almost the same level for the electrostatic probe, using all available data. Lasso regression and greedy algorithm are used to select the necessary line emissions. In conclusion, it is shown that four- or five-line intensities are sufficient to obtain almost the same quality as the one with all the other lines.
- Research Organization:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC05-00OR22725
- OSTI ID:
- 2076177
- Journal Information:
- Fusion Engineering and Design, Journal Name: Fusion Engineering and Design Vol. 196; ISSN 0920-3796
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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