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Helium I line intensity ratios in a plasma for the diagnostics of fusion edge plasmas

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147060· OSTI ID:385888
 [1]; ;  [2]; ;  [3];  [4]
  1. Machinery and Equipment Department, Keihin Product Operations, Toshiba Corporation, 2-4 Suehiro-cho, Tsurumi-ku, Yokohama 230 (Japan)
  2. Department of Energy Engineering and Science, Nagoya University, Nagoya 464-01 (Japan)
  3. National Institute for Fusion Science, Nagoya 464-01 (Japan)
  4. Department of Electrical Engineering and Electronics, Nagoya University, Nagoya 464-01 (Japan)
Helium I line intensity ratios obtained by a collisional radiative model, including new recommended excitation rate coefficients and the effects of hot electrons, enable us to measure electron density ({ital n}{sub {ital e}}) and temperature ({ital T}{sub {ital e}}) in high density plasma. Measured {ital n}{sub {ital e}} and {ital T}{sub {ital e}} using 492.2 nm (4{sup 1}{ital D}{r_arrow}2{sup 1}{ital P})/471.3 nm (4{sup 3}{ital S}{r_arrow}2{sup 3}{ital P}), 504.8 nm (4{sup 1}{ital S}{r_arrow}2{sup 1}{ital P})/471.3 nm, and 492.2 nm/504.8 nm line intensity ratios are in good agreement with the Langmuir probe results in the helium discharge plasma in the NAGDIS-I linear device (Nagoya University Divertor Simulator) for {ital n}{sub {ital e}} and {ital T}{sub {ital e}} regions of 10{sup 11}{endash}4{times}10{sup 12} cm{sup {minus}3} and 5{endash}20 eV. Hot electrons in the plasma are important for the HeI line emissions when {ital T}{sub {ital e}} is below the excitation energy {approx_equal}20 eV. A resonance scattering effect included in the calculation accounts for the experimental result of the enhanced 501.6 nm (3{sup 1}{ital P}{r_arrow}2{sup 1}{ital S}) line emission. {copyright} {ital 1996 American Institute of Physics.}
OSTI ID:
385888
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 67; ISSN 0034-6748; ISSN RSINAK
Country of Publication:
United States
Language:
English

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