Quantitative structural analysis of organic thin films: An x-ray diffraction study
- Department of Physics, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093 (United States)
The SUPREX thin film refinement of x-ray diffraction (XRD) was used to quantitatively analyze the structure of thermally evaporated iron phthalocyanine (FePc) organic thin films as a function of growth temperature and postdeposition in situ annealing time. A bilayer model was necessary to refine the FePc XRD data. Results using this model provide clear evidence that the first molecular layer of FePc contacting the sapphire substrate differs from the subsequent uniformly spaced molecular layers, indicating a Stranski-Krastanov growth mode. The {alpha}-to-{beta} structural phase transformation of FePc was observed as a function of substrate temperature. No significant effect of postdeposition in situ annealing time was observed. Atomic force microscopy (AFM) measurements reveal a temperature-dependent morphology as the FePc changes from grains, to extended films, and finally shows crystallite formation for increasing deposition temperature. Structural characteristics obtained by SUPREX refinement and AFM quantitatively agree for surface roughness and average molecular layer spacing.
- OSTI ID:
- 20719518
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 72, Issue 10; Other Information: DOI: 10.1103/PhysRevB.72.104113; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNEALING
ATOMIC FORCE MICROSCOPY
COATINGS
CRYSTAL GROWTH
CRYSTALLIZATION
DEPOSITION
EPITAXY
IRON
LAYERS
MORPHOLOGY
ORGANIC SEMICONDUCTORS
ROUGHNESS
SAPPHIRE
SOLIDS
SUBSTRATES
SURFACES
TEMPERATURE DEPENDENCE
THIN FILMS
X-RAY DIFFRACTION