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Epitaxial PtMn/NiFe exchange-biased bilayers containing directly deposited ordered PtMn

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.1852440· OSTI ID:20709697
; ;  [1]
  1. Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH (United Kingdom)
PtMn/NiFe exchange-biased bilayers have been grown epitaxially on Si (001) using molecular-beam epitaxy. Spontaneous formation of the chemically ordered face-centered-tetragonal phase of PtMn layer was confirmed without postgrowth magnetic-field annealing, whose Neel axis is perpendicular to the PtMn/NiFe interface. The exchange anisotropy field stabilizes above a PtMn thickness of 15 nm which is much lower than that for polycrystalline PtMn-based exchange-biased systems. For comparison, PtMn/NiFe exchange-biased bilayers have been prepared epitaxially on MgO (001) substrate. Spontaneous formation of the chemically ordered PtMn layer was also confirmed with Neel axis parallel to the PtMn/NiFe interface. The exchange anisotropy field of the bilayer on MgO stabilizes beyond a PtMn thickness of 15 nm as well.
OSTI ID:
20709697
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 10 Vol. 97; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English